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ATOMIC FORCE MICROSCOPY (AFM) OF SAMPLES FOR ENVIRONMENTAL APPLICATIONS WITH LABORATORY Course Sheet Academic Year of enrolment:
Professor and Collaborators:
Hours of classroom activity:
Objectives
Contents • Theoretical principles of operation of atomic force microscopy
• Methods of analysis
• Instrument set up and sample preparation
• Applications in the environmental field
Extended Syllabus • Theoretical operating principles:
-Introduction to the atomic force microscopy technique and related instrumentation for the study of the surfaces of compounds of various kinds at the nanometric scale.
• Analysis modes:
-Surface topographic analysis using Contact Mode, Tapping Mode and Peak Force Tapping (ScanAsyst in Air Mode)
-Analysis of nanomechanical properties of materials by PeakForce Quantitative Nanomechanical Property mapping (PFQNM)
-Analysis in fluid
• Instrument setup and sample preparation:
- Probe selection and installation,
- Laser alignment,
- Instrument calibration
- Optimization of scan parameters to minimize sample and probe degradation
• Analysis of materials for environmental use
- Microplastics
- Samples of corroded or degradated materials
Recommended Bibliography Lecture notes and articles distributed in class
Teaching Methods It consists of 1,5 ECTS divided in half ECTS, corresponding to 3 hours, of lectures and 1 ECTS, corresponding to 10 hours, of guided exercises in laboratory.
Evaluation methods Verification of learning:
The final exam consists in compiling an essay on the topic mainly taken from recent bibliography.
Contacts/More Information The slides projected in the classroom during the Course are available in pdf format on the teaching website and on the elearning portal. The teacher is also available during office hours for further clarifications on the topics covered in the class.
Laboratory experience are provided during the course delivery.